ISDA: 2VLG

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.5	293	20 DEGREES CELSIUS, HANGING-DROP VAPOR DIFFUSION: 1 MICROLITER KINA (7 MG/ML IN 25 MM TRIS, PH 8, 100 MM NACL PLUS 1 MICROLITER WELL SOLUTION (13 TO 15% (W/V) PEG 10,000, 0.1 M AMMONIUM ACETATE, 0.1 M BIS-TRIS, PH 5.5); CRYSTALS APPEARED AFTER ABOUT ONE DAY AND GREW TO A FINAL SIZE OF ABOUT 80 X 80 X 100 MICROMETERS WITHIN FOUR DAYS; CRYO-PROTECTION: STEPWISE TRANSFER INTO WELL SOLUTION SUPPLEMENTED WITH UP TO 25% (V/V) GLYCEROL.

Unit Cell:

a: 53.568 Å b: 55.516 Å c: 78.879 Å α: 90.00° β: 109.01° γ: 90.00°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.1 Solvent Content: 42.4

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.70	44.00	40811	1499	87.9	0.200	0.243	29.20

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.71	44.75	88.0	0.04	?	24.90	2.9	?	42220	?	-3.0	24.80

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.71	1.74	56.0		?	1.90	2.4

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-ID	?	APS	19-ID

Software