ISDA: 2VAY

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.3	?	HANGING DROP VAPOR DIFFUSION 1.5 UL 10 MG/ML COMPLEX IN 20 MM MOPS PH7.4, 150 MM NACL, 4 MM CACL2 MIX WITH 4.5 UL WELL SOLUTION, 32% PEG 3350, 50 MM TRIS PH 8.3, 50 MM MGCL2, 5 DAYS AT 20-22 DEGREES C

Unit Cell:

a: 84.920 Å b: 34.670 Å c: 62.980 Å α: 90.00° β: 113.69° γ: 90.00°

Symmetry:

Space Group: C 1 2 1

Crystal Properties:

Matthew's Coefficient: 2.05 Solvent Content: 47.7

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.94	19.77	12021	1211	94.8	0.218	0.272	34.7

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.80	50.00	89.9	0.03	?	12.10	3.5	?	15915	?	3.0	20.0

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.86	1.94	74.9		?	3.65	2.7

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		77 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	CAMD BEAMLINE GCPCC	?	CAMD	GCPCC

Software