ELECTRON MICROSCOPY

Sample

SHIGELLA FLEXNERI TYPE THREE SECRETION NEEDLE

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 5000
Reported Resolution (Å) 16.0
Resolution Method ?
Other Details A SET OF X-RAY STRUCTURE FACTORS WERE COMPUTED BY PLACING THE EM DENSITY IN A CRYSTAL CELL. THE MXIH MONOMER WAS RIGID BODY REFINED AGAINST THESE DATA WITH HARD NCS CONSTRAINTS. THE EM DENSITY FOR THE NEEDLE WAS PUT IN THIS P1 CRYSTAL CELL SO THAT SINGLE CRYSTAL X-RAY MODEL REFINEMENT PROGRAMS COULD BE USED TO FIT THE MODEL.
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space RECIPROCAL
Refinement Protocol OTHER
Refinement Target Cross-correlation coefficient
Overall B Value ?
Fitting Procedure ?
Details METHOD--RECIPROCAL SPACE FIT REFINEMENT PROTOCOL--X-RAY
Data Acquisition
Detector Type GENERIC FILM
Electron Dose (electrons/Å2) 10
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI/PHILIPS CM200T
Minimum Defocus (nm) 700
Maximum Defocus (nm) 700
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model .
Nominal Magnification 60000
Calibrated Magnification ?
Source LAB6
Acceleration Voltage (kV) 120
Imaging Details OTHER
Imaging Experiment
Task Software Package Version
MODEL FITTING BUSTER ?
RECONSTRUCTION MRC IMAGE PROCESSING PACKAGE ?
RECONSTRUCTION SPIDER ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
? GRID