X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 3-10% PEG3350, 0.1M BisTris pH6.5, 0.05M lithium sulfate, 3% 1,6-hexandiole, 0.01mM DTE, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 62.000 Å b: 100.000 Å c: 104.000 Å α: 62.00° β: 82.00° γ: 86.00°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.77 Solvent Content: 67.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.60 19.78 62199 3313 97.75 0.230 0.285 51.12
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 20 97.3 ? ? 25.64 4.4 ? 64618 -10 -10 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.67 97.1 ? ? 3.89 ? 4694
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9792 SLS X10SA
Software
Software Name Purpose Version
REFMAC refinement 5.2.0005
MAR345 data collection .
XDS data reduction .
XSCALE data scaling .
SOLVE phasing .