X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 277 NANODROP, 19.0% 2-Propanol, 19.0% PEG 4000, 5.0% Glycerol, 0.1M Citric acid pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 36.381 Å b: 36.555 Å c: 51.641 Å α: 72.030° β: 71.810° γ: 87.250°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.06 Solvent Content: 40.23
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.300 46.676 56000 2809 94.840 0.162 0.179 12.157
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.30 46.676 94.800 0.055 0.055 7.400 2.000 ? 56000 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.30 1.33 91.80 ? 0.403 1.9 1.90 3992
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 0.97945 APS 23-ID-D
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
PHENIX refinement .
SOLVE phasing .
MolProbity model building 3beta29
SCALA data scaling .
PDB_EXTRACT data extraction 3.000
MAR345 data collection CCD
MOSFLM data reduction .
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