X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.0 296 0.1M CAPS pH 10.0, 200mM Lithium sulfate, 1.2M Sodium dihydrogen phosphate, 800mM Potassium phosphate, 10% Glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 296K
Unit Cell:
a: 122.593 Å b: 58.657 Å c: 60.301 Å α: 90.00° β: 117.96° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.76
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.76 20.00 35959 1159 99.23 0.18872 0.22006 40.363
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 50.000 99.4 0.046 0.038 9.8000 3.800 ? 37460 ? ? 29.90
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.76 1.82 98.4 ? 0.35 1.400 3.70 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.97930 NSLS X29A
Software
Software Name Purpose Version
SHELXD phasing .
SHELXE model building .
REFMAC refinement 5.3.0034
ADSC data collection Quantum
HKL-2000 data reduction .
SCALEPACK data scaling .
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