X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.00 298 30% PEG 8000, 100 MM MGSO4, 2 MM MAN2, VAPOR DIFFUSION, HANGING DROP, temperature 298K, pH 6.00
Unit Cell:
a: 49.205 Å b: 38.452 Å c: 55.953 Å α: 90.00° β: 99.94° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.18 Solvent Content: 43.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.35 8.00 40605 2171 94.4 0.185 0.199 17.50
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.350 48.450 94.4 0.09200 ? 6.4000 2.500 ? 43019 ? ? 15.30
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.35 1.40 91.2 ? ? 1.970 2.40 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 ? ALS 8.2.2
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing 1.3.1