X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 10 mM MgCl2, 0.2 M ammonium acetate, 0.1 M Bis-Tris (pH=5.5) and 25% PEG 3350. Crystals were soaked with 2 mM sodium orthovanadate for 2 hours before data collection., VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 49.533 Å b: 56.356 Å c: 94.026 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 45.85
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO FREE R 1.00 10.00 135801 13574 88.7 0.1227 0.1483 17.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.00 50.0 95.5 0.122 0.122 15 9.3 136055 136055 2.0 2.0 6.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.00 1.04 71.4 ? 0.020 2.0 2.8 10056
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12B 0.9000 NSLS X12B
Software
Software Name Purpose Version
SHELX model building .
SHELXL-97 refinement .
CBASS data collection .
DENZO data reduction .
SCALEPACK data scaling .
MOLREP phasing .
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