X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 277.0 MgCl2, Tris-HCl, 30% PEG 8000, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 277.0K
Unit Cell:
a: 65.762 Å b: 92.205 Å c: 92.345 Å α: 60.08° β: 89.57° γ: 71.11°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.88 Solvent Content: 57.29
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.80 36.68 260719 5134 80.7 0.221 0.243 33.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 96.0 0.044 0.041 15.8 2.0 308057 308057 0 0 16.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.86 88.0 ? 0.272 14.0 1.7 28388
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.97900 NSLS X4C
Software
Software Name Purpose Version
CNS refinement 1.1
MAR345dtb data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELXS phasing .