X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 291 0.1M sodium citrate, 0.9M lithium sulfate, 0.5M ammonium sulfate, pH5.6, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 47.900 Å b: 59.700 Å c: 60.200 Å α: 73.00° β: 90.70° γ: 76.40°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 42.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.90 14.92 43261 2325 93.80 0.19791 0.25374 23.311
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 30 82.5 0.057 0.064 11.59 2.5 68005 56130 ? 3 22.579
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.7 1.8 49.9 ? 0.176 7.32 1.3 5343
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.966 SLS X06SA
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
XDS data scaling .
XDS data reduction .
PHASER phasing .