X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 294 100mM Bis-Tris pH 6.5, 25% PEG 3350, 200mM Lithium sulfate, VAPOR DIFFUSION, temperature 294K
Unit Cell:
a: 55.252 Å b: 49.386 Å c: 104.211 Å α: 90.000° β: 102.750° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.52 Solvent Content: 51.20
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 2.170 20.000 28907 1474 98.630 0.237 0.291 51.455
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.170 101.640 98.700 0.109 0.109 11.5 3.900 29333 28952 0 0 34.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.17 2.29 97.30 ? 0.573 1.7 3.80 4094
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.97958 APS 31-ID
Software
Software Name Purpose Version
SCALA data scaling .
REFMAC refinement .
PDB_EXTRACT data extraction 3.000
MAR345 data collection CCD
MOSFLM data reduction .
SHELXCD phasing .
SHELXE model building .