X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 drop: 0.1 M Tris pH 8.5, 9% PEG2KMME; well: 0.1 M Tris pH 8.5, 18% PEG2KMME, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 124.210 Å b: 124.210 Å c: 48.502 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42 21 2
Crystal Properties:
Matthew's Coefficient: 2.47 Solvent Content: 50.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.4 26.15 14042 730 94.69 0.23087 0.27213 39.969
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 26.15 99.8 ? 0.094 28.1 8.8 15527 15472 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4 2.49 99.5 ? ? 8.2 6.1 1491
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 170 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.9794 APS 22-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0005
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SOLVE phasing .