X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298 0.1M Bis-Tris pH 6.5, 25% PEG 3350, 0.2M Ammonium acetate, 10mM Magnesium chloride, 10mM O-Succinyl benzoate, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 44.543 Å b: 52.877 Å c: 61.449 Å α: 70.53° β: 87.22° γ: 85.56°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.92 Solvent Content: 35.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.76 34.25 47613 2875 91.1 0.218 0.251 19.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 50.0 92 0.042 ? 23.2 3.8 48053 48053 0 ? 22.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.76 1.82 95.2 ? ? 2 3.7 4915
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.97950 NSLS X29A
Software
Software Name Purpose Version
CNS refinement 1.1
CBASS data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
MOLREP phasing .