X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 294 100mM Sodium cacodylate pH 6.5, 400mM Sodium acetate pH 4.6, 30% PEG8000, pH 5.5, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 37.349 Å b: 47.373 Å c: 65.492 Å α: 91.06° β: 92.36° γ: 73.06°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.00 Solvent Content: 38.60
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.90 20.00 31951 1037 97.28 0.17978 0.23838 24.503
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 50.000 97.7 0.114 0.104 4.2000 2.000 ? 33092 ? -0.500 19.439
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.97 96.6 ? 0.78 0.900 2.00 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.97958 APS 31-ID
Software
Software Name Purpose Version
MOLREP phasing .
REFMAC refinement 5.3.0034
MAR345 data collection CCD
MOSFLM data reduction .
SCALA data scaling .