X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 294 2M Ammonium sulfate, 0.1M Tris-HCl, 10% Glycerol, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 185.401 Å b: 185.401 Å c: 185.401 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 2 3
Crystal Properties:
Matthew's Coefficient: 3.11 Solvent Content: 60.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.50 20.00 70754 2207 99.80 0.21632 0.25318 64.717
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 50.000 99.8 0.074 0.059 6.5000 5.700 ? 142014 ? -0.500 70.85
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.59 99.9 ? 0.800 1.300 5.10 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID ? APS 31-ID
Software
Software Name Purpose Version
SHELX model building .
REFMAC refinement 5.3.0034
MAR345 data collection CCD
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing .