X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 291 40% PEG 4000, 0.1M Magnesium nitrate, 0.1M Sodium acetate pH 5.0, MICROBATCH UNDER OIL, temperature 291K
Unit Cell:
a: 37.081 Å b: 130.340 Å c: 39.047 Å α: 90.00° β: 115.87° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.90 Solvent Content: 35.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.72 19.96 67213 2691 96.5 0.183 0.203 12.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.72 50.0 96.7 0.046 ? 25.9 3.6 67796 67796 0.0 0.0 11.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.72 1.78 85.5 ? ? 14.4 2.8 7026
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97913 NSLS X4A
Software
Software Name Purpose Version
CNS refinement 1.1
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing D/E
SOLVE phasing .
RESOLVE phasing .