ISDA: 2QKS

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.2	293.0	10-15% (w/v) PEG 4000, 0.05M sodium citrate, 0.2M potassium phosphate, 0.08M bis-tris, 0.12M KCl, 0.003M dithiothreitol, 0.02M tris (2-carboxyethyl) phosphine hydrochloride, 0.0026M 1,2-dihexanoyl phosphatidylinositol 4,5-biphosphate, 0.016M nonylglucoside , pH 6.2, VAPOR DIFFUSION, SITTING DROP, temperature 293.0K

Unit Cell:

a: 98.416 Å b: 98.416 Å c: 92.624 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 4

Crystal Properties:

Matthew's Coefficient: 3.10 Solvent Content: 60.30

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.2	29.5	43987	2179	97.9	0.232	0.256	51.229

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.2	100	97.9	?	0.054	17.0	3.7	43991	43991	0	-3	46.1

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.20	2.28	99.7	?	0.309	3.9	3.7	4450

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100.0 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X29A	1.1000	NSLS	X29A

Software