X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 291 2M Ammonium sulfate, 0.1 M acetate pH 4.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 148.030 Å b: 148.030 Å c: 160.090 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41
Crystal Properties:
Matthew's Coefficient: 4.45 Solvent Content: 72.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT throughtout 2.400 43.0 55092 5612 82.000 0.173 0.211 27.427
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 43 82.6 0.115 0.115 7.1 2.76 67185 55092 0.0 0.0 38
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.55 52.0 ? 0.302 2.1 1.6 8320
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 290 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ DW 1.541 ? ?
Software
Software Name Purpose Version
CNS refinement .
PDB_EXTRACT data extraction 2.000
CrystalClear data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
EPMR phasing .