X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 277 Protein at 35 mg/ml with a reservoir of 22-30 % (w/v) PEG4000, 0.1 M Tris-HCl PH 8.5, 0.2 M MgCl2, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 64.157 Å b: 88.755 Å c: 98.445 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 3.03 Solvent Content: 59.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.68 20.0 58785 5969 91.0 0.246 0.237 15.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.68 20.0 95.3 ? 0.067 12.7 6.5 64715 61674 1.0 2.0 14.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.68 1.74 87.8 ? 0.268 5.5 4.5 5625
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-BM 1.0 APS 17-BM
Software
Software Name Purpose Version
CNX refinement 2002
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .
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