X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.0 293.15 0.1 M CHES pH 10.0, 18% w/v PEG 8000, VAPOR DIFFUSION, SITTING DROP, temperature 293.15K
Unit Cell:
a: 97.150 Å b: 76.540 Å c: 137.900 Å α: 90.00° β: 93.07° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.04 Solvent Content: 59.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.7 20 54390 5535 97.6 0.253 0.276 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 50 98.1 ? 0.067 14.36 3.88 106277 106277 ? -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.70 2.87 94.4 ? 0.438 3.04 3.76 16547
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.00800, 1.00900, 1.01000 SLS X06SA
Software
Software Name Purpose Version
ADSC data collection Quantum
SHARP phasing .
CNS refinement 1.1
XDS data reduction .
XDS data scaling .