X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.05 293 0.1 M sodium citrate, 1.9 M ammonium sulfate, 500 mM NaCl, 10% 2-methyl-2,4-pentanediol, 10 mM MgCl2, pH 5.05, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 88.246 Å b: 88.246 Å c: 159.107 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 3.30 Solvent Content: 62.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.20 36.27 29321 1565 94.5 0.219 0.240 39.73
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 77.171 94.8 0.11700 0.11700 4.0000 3.600 ? 30948 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.32 71.6 ? 0.57800 1.200 3.60 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D ? APS 23-ID-D
Software
Software Name Purpose Version
SCALA data scaling .
PHASER phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 2.000
MOSFLM data reduction .
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