X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6 291 Droplets containing 0.5 mM oligonucleotide, 0.8 M ammonium sulfate, 0.05 M MES, pH 6.0, were equilibrated against a reservoir of 1.6 M ammonium sulfate, 0.1 M MES, pH 6.0. , VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 22.900 Å b: 32.060 Å c: 42.930 Å α: 96.24° β: 83.87° γ: 93.91°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.02 Solvent Content: 39.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.10 10.0 43113 2152 94.2 0.110 0.142 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.10 42.45 93.9 0.059 ? ? 3.4 48767 45791 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.10 1.14 90.7 ? ? ? 2.6 4414
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 120 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.9199 APS 22-ID
Software
Software Name Purpose Version
HKL-2000 data collection .
EPMR phasing .
SHELXL-97 refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .