X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 288 23% w/v PEG 3350, 0.1M Ammonium Sulphate, 0.1M Bis-Tris, pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 288K
Unit Cell:
a: 195.630 Å b: 134.180 Å c: 48.420 Å α: 90.00° β: 94.07° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.88 Solvent Content: 57.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.20 19.75 58292 3068 94.3 0.20721 0.24728 37.145
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 20 94.3 0.78 0.14 11.59 2.26 134273 59477 ? -3 37.145
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.2 2.256 93.0 ? 0.351 5.4 2.24 35395
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-2 1.043 MAX II I911-2
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
MLPHARE phasing .
REFMAC refinement 5.2.0019
PDB_EXTRACT data extraction 2.0
MAR345dtb data collection .
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
Feedback Form
Name
Email
Institute
Feedback