X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 295 1.4 M Ammonium citrate pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 51.820 Å b: 51.820 Å c: 69.329 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4 21 2
Crystal Properties:
Matthew's Coefficient: 2.05 Solvent Content: 40.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.70 32.40 2592 269 99.86 0.216 0.279 39.850
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.70 32.4 99.9 0.155 ? 6.4 15.5 2872 2872 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.7 2.8 99.6 ? ? 2.1 9.5 263
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97983 APS 19-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0000
SBC-Collect data collection .
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
HKL-3000 phasing .
SHELXCD phasing .
SHELXD phasing .
SHELXE model building .
MLPHARE phasing .
SOLVE phasing .
RESOLVE phasing .
PHENIX phasing .