X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 277 50% PEG 300, 0.2M Sodium chloride, 0.1M Sodium potassium phosphate, pH 6.2, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 139.100 Å b: 139.100 Å c: 109.620 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 4.00 Solvent Content: 69.27
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.510 29.361 42226 2127 99.630 0.177 0.212 28.714
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.51 50 99.7 0.061 ? 19.0 7.5 42245 42245 0 0 67.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.51 2.66 98.5 ? ? 3.39 7.5 6634
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.79887 SLS X10SA
Software
Software Name Purpose Version
PHASER phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 2.000
MAR345 data collection CCD
XDS data reduction .
XDS data scaling .
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