X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.91 293 0.1 M lithium sulphate, 20% polyethylene glycol (MW2000), 0.1M Tris (pH 8.5), pH 6.91, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 25.300 Å b: 57.100 Å c: 72.100 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.92 Solvent Content: 31.918
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R 1.00 20.00 107245 2832 98.3 0.1796 0.1515 10.2
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.000 20 98.300 0.101 ? 8.820 3.4 109088 107245 ? -3.00 8.243
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.00 1.20 96.90 ? ? 3.9 2.35 44537
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X12 0.900 EMBL/DESY, HAMBURG X12
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing .
SHELX refinement .
PDB_EXTRACT data extraction 2.000
MAR345dtb data collection .
XDS data reduction .
SHELXL-97 refinement .