X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.1 277 NANODROP, 0.2M Li3Citrate, 20.0% PEG 3350, No Buffer pH 8.1, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 78.154 Å b: 78.154 Å c: 77.755 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.32 Solvent Content: 46.98
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.400 27.566 9883 475 99.880 0.188 0.223 48.553
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.40 27.566 99.900 0.086 0.086 6.400 13.500 ? 9920 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.46 100.00 ? 0.649 1.2 12.00 710
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.97917 SSRL BL11-1
Software
Software Name Purpose Version
MolProbity model building 3beta29
SOLVE phasing .
REFMAC refinement 5.2.0005
SCALA data scaling .
PDB_EXTRACT data extraction 2.000
MAR345 data collection CCD
MOSFLM data reduction .
CCP4 data scaling (SCALA)
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