ISDA: 2PFS

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	293	0.2M Sodium chloride, 0.1M HEPES pH 7.5, 25% PEG3350, 2% Isopropanol, VAPOR DIFFUSION, temperature 293K

Unit Cell:

a: 76.000 Å b: 76.000 Å c: 42.987 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 3 2 1

Crystal Properties:

Matthew's Coefficient: 2.14 Solvent Content: 42.47

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	2.25	50.00	6538	329	97.57	0.19758	0.25455	52.420

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.25	50.0	97.6	0.06	0.06	58.5	11.1	6882	6882	0	-3	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.25	2.29	81.5	?	0.486	2.9	7.7	277

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-ID	0.97918	APS	19-ID

Software