X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 193 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SYNCHROTRON | APS BEAMLINE 22-BM | 1.000 | APS | 22-BM |
| Software Name | Purpose | Version |
|---|---|---|
| REFMAC | refinement | 5.2.0019 |
| HKL-2000 | data collection | . |
| XDS | data reduction | . |
| XDS | data scaling | . |
| MOLREP | phasing | . |
