X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 294 30 % PEG Monomethylether 2000, 0.2M Ammonium sulfate, 0.1 M Sodium acetate, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 58.770 Å b: 58.770 Å c: 52.340 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 2.79 Solvent Content: 55.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.700 29.39 11381 544 99.830 0.195 0.253 32.275
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 99.7 0.056 ? 18.1 6.2 11401 11401 0 0 31.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.7 1.8 98.5 ? ? 1.88 3.4 1794
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.95400 SLS X10SA
Software
Software Name Purpose Version
PHASER phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 2.000
MAR345 data collection CCD
XDS data reduction .
XDS data scaling .