2P4X

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 278 PEG 4000, Acetate, HEPES, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 278K
Unit Cell:
a: 42.854 Å b: 50.632 Å c: 67.581 Å α: 73.87° β: 74.19° γ: 89.78°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 52.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.90 48.49 38168 3824 92.4 .187 .230 41.2
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 48.49 97.3 0.06 0.049 23.3 3.8 41287 40173 2 2 22.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 1.93 92.4 ? 0.532 1.72 3.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.97925 APS 22-ID
Software
Software Name Purpose Version
CNS refinement 1.1
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SOLVE phasing .