X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.2 293 17% PEG 5000-MME, 0.1 M Tris-HOAc, 0.1 M KSCN, 30% ethylene glycol, pH 7.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 58.020 Å b: 229.210 Å c: 114.930 Å α: 90.00° β: 90.11° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 52.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.24 20 46491 1023 98.2 ? 0.305 95.93
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.24 30 98 0.140 5.9 9.81 1.79 94083 92159 ? -3 84.879
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.24 3.5 98 ? 37.9 2.11 1.82 94083
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.899 SLS X06SA
Software
Software Name Purpose Version
AMoRE phasing .
CNS refinement .
XDS data reduction .
XSCALE data scaling .