X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 291 100mM Tris-HCl pH 8.5, 8% PEG 8000, 50 mM NaCl, 5 mM DTT, 5 mM SAM, MICROBATCH UNDER OIL, temperature 291K
Unit Cell:
a: 42.403 Å b: 74.737 Å c: 79.423 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.00 37.41 30301 2946 92.0 0.213 0.23 17.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 37.41 98.3 0.08 0.064 19.81 6 32699 32699 0 0 5.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.07 100 ? 0.246 8.51 6.3 3288
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97911 NSLS X4A
Software
Software Name Purpose Version
CNS refinement 1.1
ADSC data collection QUANTUM
HKL-2000 data reduction .
HKL-2000 data scaling .
SnB phasing .
SOLVE phasing .
RESOLVE phasing .
XTALVIEW refinement .