X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 295 2.0M SODIUM CHLORIDE, 10% PEG 6000, pH 7.50, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 64.346 Å b: 70.376 Å c: 150.914 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.34 Solvent Content: 47.36
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.777 19.63 62920 3366 ? 0.19208 0.23531 33.085
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.777 25.474 99.400 0.08 0.08 6.200 14.400 ? 66447 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.777 1.87 96.10 ? 0.383 2.0 12.60 9276
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.97961 APS 31-ID
Software
Software Name Purpose Version
SCALA data scaling .
SHELX phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 2.000
MAR345 data collection CCD
MOSFLM data reduction .
CCP4 data scaling (SCALA)
SHELXD phasing .