X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 291 15mM Na-SCN, 5%(v/v) ethanol, 200mM phosphate buffer pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 100.600 Å b: 60.800 Å c: 62.100 Å α: 90.00° β: 116.10° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.44 Solvent Content: 49.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.70 19.78 33178 1745 94.83 0.18055 0.22147 20.962
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 92.2 0.041 ? 14.9 2.1 ? 36828 ? ? 26.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.7 1.75 48.4 ? ? 5.1 1.5 4537
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-3 1.3 MAX II I911-3
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
XDS data reduction .
XSCALE data scaling .
MOLREP phasing .