X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.3 277 20% PEG 3350, 0.2 M ammonium citrate, 4% polypropylene glycol, 0.1 M sodium cyanide, 0.01 M hepes, pH 5.3, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 45.740 Å b: 60.557 Å c: 145.804 Å α: 99.17° β: 96.97° γ: 92.43°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.73 Solvent Content: 54.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.80 30 117587 6195 87.43 0.20227 0.24958 35.119
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 30 87.4 0.045 ? ? 3.7 141630 123785 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.8 1.86 47.8 ? ? ? 2.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 1.5418 ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.1.24
HKL-2000 data collection .
DENZO data reduction .
SCALEPACK data scaling .
SOLVE phasing .
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