X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.5 294 0.1 M sodium citrate, 16 % polyethylene glycol 6000, 5% isopropanol, pH 3.5, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 56.400 Å b: 56.400 Å c: 39.400 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 63
Crystal Properties:
Matthew's Coefficient: 2.06 Solvent Content: 40.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.12 28.2 4115 189 99.28 0.18 0.254 22.672
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.12 28.2 99.3 0.051 0.051 52.9 12.2 4118 4118 0.0 0.0 28.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.12 2.20 93.0 ? 0.141 12.5 10.9 386
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.75 APS 22-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
MAR345 data collection software
HKL-2000 data reduction .
SCALEPACK data scaling .
PHASER phasing .
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