X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 294 30% PEG 200, 5% PEG 3000, 100 mM MES pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 57.455 Å b: 63.681 Å c: 62.127 Å α: 90.00° β: 106.94° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.61 Solvent Content: 52.89
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.50 50.00 60990 3247 93.55 0.16283 0.19555 31.648
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 50 93.6 ? 0.064 23.8 7.0 64266 64266 0 0 20.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.55 61.1 ? 0.247 4.8 4.6 4195
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.000, 0.9793, 0.9718, 0.9795 APS 22-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
SERGUI data collection .
HKL-2000 data reduction .
SCALEPACK data scaling .
SOLVE phasing .