X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 297 15% PEG 3350, 0.3 M ammonium acetate, 0.2 M sodium citrate, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 297K
Unit Cell:
a: 87.325 Å b: 87.325 Å c: 167.213 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 2 2
Crystal Properties:
Matthew's Coefficient: 2.93 Solvent Content: 58.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.82 50 27920 757 97.97 0.19894 0.23911 22.912
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.82 50 98.1 0.105 0.105 9.0 9.0 28702 28702 0 0 22.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.82 1.89 87.1 ? 0.859 2.1 6.3 2507
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 0.97918 APS 17-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
JDirector data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SOLVE phasing .
RESOLVE phasing .
Coot model building 0.1.2