X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 291 100 mM NaCacodylate pH 5.0, 200 mM NaAcetate, 26% PEG 8000, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 31.634 Å b: 50.017 Å c: 32.711 Å α: 90.00° β: 90.86° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.84 Solvent Content: 33.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 0.84 20.0 92310 4630 99.7 0.0904 0.1078 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.84 20 99.7 0.071 0.071 31.8 4.0 92458 92458 0 0 4.64
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.84 0.87 99.0 ? 0.224 2.5 1.6 9108
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 0.82653 ALS 8.3.1
Software
Software Name Purpose Version
SHELXL-97 refinement .
MOLREP phasing .
ELVES refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .