X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 100 mM Tris, pH7.5, 200 mM ammonium acetate, 150 mM NaCl, and 20% (w/v) PEG 6000 or PEG 8000, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 78.261 Å b: 154.062 Å c: 124.881 Å α: 90.00° β: 98.91° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.74 Solvent Content: 55.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.900 30.000 62969 3206 97.390 0.212 0.272 25.511
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 30 97.4 0.114 0.114 13.4 3.5 65814 64098 2 2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.9 3.0 96.6 ? 0.42 3.3 3.4 6571
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C ? NSLS X4C
Software
Software Name Purpose Version
REFMAC refinement 5.2.0003
PDB_EXTRACT data extraction 2.000
MAR345 data collection 345DTB
DENZO data reduction .
SCALEPACK data scaling .
MOLREP phasing .
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