X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 102.0 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU | 1.54178 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| d*TREK | data scaling | 8.0SSI |
| REFMAC | refinement | . |
| PDB_EXTRACT | data extraction | 2.000 |
| CrystalClear | data collection | (MSC/RIGAKU) |
| CrystalClear | data reduction | (MSC/RIGAKU) |
| CrystalClear | data scaling | (MSC/RIGAKU) |
| PHASER | phasing | . |
