X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 100.0 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU | 1.5418, 0.97907, 0.97922, 0.99298 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| SOLVE | phasing | . |
| REFMAC | refinement | 5.2.0005 |
