X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 294 5% polyethylene glycol 8000, 50 mM MgCl2 and 100 mM NH4H2PO4, pH 4.5, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 125.900 Å b: 125.900 Å c: 138.200 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 3.40 Solvent Content: 63.82
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.10 35.10 12161 593 99.45 0.227 0.267 81.516
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.1 35.1 99.5 0.064 0.064 44.9 10.0 12173 12173 0.0 0.0 106.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.10 3.21 100.0 ? 0.449 4.2 8.3 1193
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.076 APS 22-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
SERGUI data collection .
HKL-2000 data reduction .
SCALEPACK data scaling .
SOLVE phasing .