ISDA: 2NP5

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.4	293	0.2M Ca Chloride, 0.1M HEPES pH 7.4, 20% PEG3350, 0.3M NDSB195, VAPOR DIFFUSION, temperature 293K

Unit Cell:

a: 50.721 Å b: 52.230 Å c: 72.853 Å α: 102.31° β: 107.25° γ: 89.71°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.06 Solvent Content: 40.35

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.80	25.80	58508	3130	95.47	0.17881	0.21946	33.106

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.80	50.0	96.7	0.07	0.063	24.6	2.3	63744	61651	0	-3	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.80	1.83	94.6	?	0.376	1.9	2.3	3019

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-BM	0.97907	APS	19-BM

Software