ISDA: 2JKI

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.5	277	INITIAL MULTIPLE CRYSTALS WERE GROWN BY VAPOR DIFFUSION AT 4 C AGAINST 26% W/V PEG4000, 100 MM TRIS (PH 8.5), AND 200 MM MAGNESIUM SULPHATE. SUBSEQUENT STREAK SEEDING INTO SOLUTIONS OF 16% W/V PEG4000, 100 MM TRIS (PH 8.5), AND 200 MM MAGNESIUM SULFATE PRODUCED SINGLE THIN PLATES.

Unit Cell:

a: 100.268 Å b: 129.654 Å c: 135.998 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 21 21 21

Crystal Properties:

Matthew's Coefficient: 4 Solvent Content: 69.26

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	?	3.30	38.072	50605	2615	98.25	0.2009	0.2383	53.30

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.20	100.00	99.3	0.17	?	7.90	3.5	?	29660	?	.	59.73

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.20	3.37	98.0		?	1.70	3.5

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ESRF BEAMLINE ID23-1	?	ESRF	ID23-1

Software