X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.50 ? 30%(V/V) PEG 400, 0.1 M TRIS-HCL PH 8.5, 0.2 M SODIUM CITRATE
Unit Cell:
a: 137.838 Å b: 44.484 Å c: 100.310 Å α: 90.00° β: 107.96° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.78 Solvent Content: 67.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION OTHER THROUGHOUT 3.10 34.0 9700 502 ? 0.2621 0.2755 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.100 33.900 99.4 0.10000 ? 4.9000 5.800 ? 62274 ? 0.000 15.400
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.10 3.27 99.4 ? 2.300 6.00
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 120.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-1 ? ESRF ID14-1
Software
Software Name Purpose Version
SOLOMON model building .
TNT refinement 5.6.1
SCALA data scaling .
SHELXCD phasing .
SHELXD phasing .
SHARP phasing .
SOLOMON phasing .
RESOLVE phasing .
ARP/wARP phasing .
HELIXBUILD phasing .