X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298 0.8 Ammonium Sulfate, 100 mM citrate soaked in saturated dithionite, and then backsoaked in oxygenated mother liquor prior to freezing, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 65.073 Å b: 173.836 Å c: 91.977 Å α: 90.00° β: 89.96° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.52 Solvent Content: 51.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.9 20 43289 2170 95.7 0.22 0.285 36
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 50 100 0.079 ? 15.1 3.8 44966 44966 3.3 3.3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 3.00 100 ? ? 3.3 3.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 120 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 0.9919 ALS 8.2.2
Software
Software Name Purpose Version
HKL-2000 data collection .
MOLREP phasing .
CNS refinement 1.1
HKL-2000 data reduction .
HKL-2000 data scaling .