X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 291 0.1M Sodium acetate, 16% PEG3350, 0.1 M Sodium Cholride, and 5mM DTT, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 51.858 Å b: 88.760 Å c: 74.704 Å α: 90.00° β: 103.26° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.08 Solvent Content: 40.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.50 33.35 169569 16393 81.5 0.169 0.193 16.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 33.35 0.94 0.053 0.046 18.4 3.2 207853 195382 0 0 13.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.5 1.55 97.4 ? 0.304 3.2 2.8 20271
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97914 NSLS X4A
Software
Software Name Purpose Version
CNS refinement 1.1
ADSC data collection QUANTUM
HKL-2000 data reduction .
HKL-2000 data scaling .
SnB phasing .
SOLVE phasing .
RESOLVE phasing .