X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 295 30% peg 4000, 0.1 M Tris-HCl, 0.2 M Magnesium Chloride, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 55.710 Å b: 57.770 Å c: 107.600 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.84 Solvent Content: 56.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.88 18.96 22667 1219 ? 0.2 0.25559 26.247
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.870 50.000 89.000 0.08 0.08 13.300 3.100 54857 48823 ? ? 22.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.87 1.94 60.40 ? 0.238 ? 2.50 3324
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9791 NSLS X29A
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
SHELX refinement .
DENZO data reduction .
PDB_EXTRACT data extraction .
CBASS data collection .
HKL-2000 data reduction .
SCALEPACK data scaling .
SHELXD phasing .
Feedback Form
Name
Email
Institute
Feedback